Anniversary Panel
Organizer:
- Maksim Jenihhin, TalTech, Estonia
Moderators:
- Elena-Ioana Vatajelu, TIMA, France
- Maksim Jenihhin, TalTech, Estonia
Panellists:
- Hans-Joachim Wunderlich, U Stuttgart, Germany
- Jennifer Dworak, SMU, USA
- Annachiara Ruospo, PoliTo, Italy
- Jeff Rearick, AMD, USA
- Matteo Sonza Reorda, PoliTo, Italy
- Yervant Zorian, Synopsys, USA/Armenia
Observer:
- Said Hamdioui, TU Delft, Netherlands
Summary: This milestone panel unites ETS veterans, early career voices, industry leaders, and guests from neighbouring communities to reflect on three decades of progress and sketch the road ahead. We will look back at the breakthroughs in testing, reliability, safety, and security that have defined ETS since 1996, identifying the turning points that broadened the symposium's scope and the audience. We are going to touch on the topics of the mission and impact of test-related events in Europe and globally, AI-assisted research and the dominance of research to support the progress of AI, a view on all the competing Chip Acts and challenges coming along with protectionism, as well as trends in European research funding and research topics.
The discussion will spotlight practical routes to consolidation and closer ties with sister conferences and industry. The session will frame a strategy to keep the European Test Symposium excellent, open, and inclusive for the next generation.
Bios of the Panellists
Hans-Joachim Wunderlich is a Professor Emeritus of the University of Stuttgart and a Life Fellow of IEEE. He is the founder of the Institute of Computer Architecture and Computer Engineering of the University Stuttgart and a co-founder of ETS, both in the year 1996. From 2008 to 2014, he was the chair of the ETS Steering Committee. He published more than 350 articles, book contributions and papers in the entire area of digital test, fault-tolerance and design automation.
Jennifer Dworak is a Distinguished University Professor at Southern Methodist University and is a faculty member in the Department of Electrical and Computer Engineering. She is also the Associate Director for the AT&T Center for Virtualization. Her research interests include manufacturing test, the reliability of digital circuits and systems, and hardware security. She is currently helping to lead the Texoma Semiconductor Tech Hub, which received official designation by the U.S. Economic Development Administration (EDA) in October of 2023. Jennifer holds PhD, MS, and BS degrees in electrical engineering from Texas A&M University in College Station, TX.
Annachiara Ruospo received her Ph.D. degree in Computer Engineering from Politecnico di Torino, Italy, in 2022. She conducted her Master's thesis at ETH Zurich's Institute of Integrated Systems in 2018. During her doctoral studies, she was a Visiting Ph.D. Student at the Institute of Nanotechnology at École Centrale de Lyon, France, in 2021. She is currently an Assistant Professor in the Department of Control and Computer Engineering at Politecnico di Torino, Italy. Her primary research interests lie in the safety, reliability, and security of AI systems. She collaborates with academic and industrial partners to develop reliability assessment solutions that address the growing challenges posed by AI systems.
Jeff Rearick has over 40 years of experience in the test field. The first half of his career was spent at Hewlett-Packard (and the spin-off to Agilent Technologies), the latter half at Advanced Micro Devices, with the common theme of Design For Testability throughout. Jeff serves on the Steering Committee of the International Test Conference (where he was Program Chair in 2023), is busily working as the Editor for draft standards in three related IEEE Working Groups (1687, P1687.1, P1687.2), and holds 50 patents. He has degrees from Purdue University and the University of Illinois.
Matteo SONZA REORDA took both the MS degree in Electronics and the PhD degree in Computer Engineering from Politecnico di Torino (Italy). Since 1990 he is with the Dept. of Control and Computer Engineering of the Politecnico di Torino, where he currently is a Full Professor and leads a research group working on test and fault tolerant design of ICs and systems. He published more than 400 papers on these topics, and is involved in several research projects with companies and public bodies. He is a Fellow of IEEE.
Yervant Zorian is the President of Synopsys Armenia, Chief Architect and Fellow at Synopsys. Formerly, he was Vice President and Chief Scientist of Virage Logic, Chief Technologist at LogicVision, and a Distinguished Member of Technical Staff AT&T Bell Laboratories. He is currently the President of IEEE Test Technology Technical Council (TTTC), the founder and chair of the IEEE 1500 Standardization Working Group, the Editor-in-Chief Emeritus of the IEEE Design and Test of Computers and an Adjunct Professor at University of British Columbia. He served on the Board of Governors of Computer Society and CEDA, was the Vice President of IEEE Computer Society, the General Chair of the 50th Design Automation Conference (DAC) and the 50th International Test Conference (ITC) as well as several other symposia and workshops.
